Semiconductor Parameter Test at James Watt Nanofabrication Centre, University of Glasgow


w: http://www.jwnc.gla.ac.uk/electrical.html

Semiconductor Parameter Test with Integrated CV: The Cascade Microtech Microchamber (up to 150 mm substrate capability) also has an Agilent B1500A Semiconductor Parameter Test system with integrated CV test card and variable duty-cycle pulsed measurement capability down to 10 ns. There are also 3 older HP Semiconductor Parameter Analysers with a range of probe stations for dc characterisation.

Hosted by: James Watt Nanofabrication Centre, University of Glasgow.

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